CISC RFID Xplorer ready to perform tagged-item testing
Klagenfurt (Austria), Mountain View CA (USA) – 24th February, 2015: With the release and publication of the GS1 Tagged Item Performance Protocol CISC introduces the TIPP extensions for its RFID test and measurement product CISC RFID Xplorer. The Xplorer performs measurement and tests based on “tagged-item test procedure” defined by the Tagged Item Performance Protocol (TIPP) Guidelines. TIPP Guidelines provide a standard means to express performance requirements and a standard test protocol to verify the performance of a tagged items in retail environments.
The CISC RFID Xplorer can be configured as a Tagged Item Performance Tester according the GS1 Tagged-Item Performance Protocol (TIPP). In this mode, Xplorer provides a fast switch to four linear antennas. Along with the CISC’s rotatable test platform, the read and backscatter sensitivity of tagged items are tested at different angles in 3D. The result accuracy is maintained due to Xplorer self-calibration and optional traceable calibration according ISO/IEC 17025, which is performed at a certified independent test lab.
The CISC RFID Xplorer provides high transmit power of 4 W EIRP and premium receive sensitivity of -90 dBm, which makes it well suitable for testing of tagged items, which are difficult to read (such as ones containing liquids or metals). By supporting extended memory tests and providing the cryptographic functionality, Xplorer already now meets the test requirements on privacy and secure data transfer between readers and tags.
For further information or demo appointments please feel free to contact us at www.cisc.at/contact.
About CISC RFID Xplorer
Xplorer is a compact high-precision test instrument to measure performance of RFID devices and application setups, verify conformance and support the development of readers, tags and chips. Xplorer 200 provides new upgraded features such as extended read and write memory tests and test support for crypto suites fully supporting GS1 EPCglobal and ISO/IEC test standards. Xplorer 200 is the first device to perform conformance tests of all Brazil RFID test Standards such as SINIAV, ARTESP and Brazil ID. Xplorer can be used to measure both standalone tags and tags applied to products. It is also able to perform a complete analysis of multiple tags in the field and reader to tag communication.
For more information visit www.cisc.at/xplorer or meet us at RFID Journal Live (Booth# 245) in San Diego, USA, 15-17th April 2015.
Appointment inquiries are welcomed under www.cisc.at/contact.
About CISC Semiconductor
CISC Semiconductor GmbH is an international oriented and highly awarded company that provides competitive and innovative products and technology for design and verification of heterogeneous networked embedded microelectronic systems.
We deliver worldwide both products and engineering services to our customers being represented in the Semiconductor, Automotive, Wireless Communication and RFID industry. Leading world companies rely on our technology and expertizes during the development of their reliable products, satisfying the latest safety and security standards that are embedded in day to day life.
CISC Semiconductor was founded in 1999 and is 100% privately owned. The company is managed by an international team of highest skilled experts. Our headquarters office is based in Klagenfurt, Austria. Since 2007 we operate an R&D office in Graz, Austria. In 2012 we founded our 100% subsidiary CISC Semiconductor Corp. in Mountain View (CA), USA.
Debangana Mukherjee MSc.
CISC Semiconductor GmbH
9020 Klagenfurt, Austria
Phone: +43 (463) 508 808 – 24
Fax: +43 (463) 508 808 – 18
CISC Semiconductor Corp.
800 West El Camino Real, Suite 180
Mountain View, CA 94040, USA
Phone: +1 (650) 318 6305
Fax: +1 (650) 963 5092